IEEE - Institute of Electrical and Electronics Engineers, Inc. - On Common-Mode Skewed-Load and Broadside Tests

2008 21st International Conference on VLSI Design

Author(s): I. Pomeranz ; S.M. Reddy ; S. Kundu
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 2008
Conference Location: Hyderabad, India
Conference Date: 4 January 2008
Page(s): 151 - 156
ISBN (Paper): 0-7695-3083-4
ISSN (Paper): 1063-9667
DOI: 10.1109/VLSI.2008.16
Regular:

Two-pattern tests for delay faults in standard scan circuits can be of one of two types: skewed-load or broadside. Each type of tests creates different conditions during test application due to... View More

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