IEEE - Institute of Electrical and Electronics Engineers, Inc. - On-Chip Process Variation Detection Using Slew-Rate Monitoring Circuit

2008 21st International Conference on VLSI Design

Author(s): A. Ghosh ; R.M. Rao ; Jae-joon Kim ; Ching-Te Chuang ; R.B. Brown
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 2008
Conference Location: Hyderabad, India
Conference Date: 4 January 2008
Page(s): 143 - 149
ISBN (Paper): 0-7695-3083-4
ISSN (Paper): 1063-9667
DOI: 10.1109/VLSI.2008.67
Regular:

The need for efficient and accurate detection schemes to mitigate the impact of process variations on the parametric yield of integrated circuits has increased in the nm design era. In this paper,... View More

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