IEEE - Institute of Electrical and Electronics Engineers, Inc. - A Robust Architecture for Flip-Flops Tolerant to Soft-Errors and Transients from Combinational Circuits

2008 21st International Conference on VLSI Design

Author(s): A. Jagirdar ; R. Oliveira ; T.J. Chakraborty
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 2008
Conference Location: Hyderabad, India
Conference Date: 4 January 2008
Page(s): 39 - 44
ISBN (Paper): 0-7695-3083-4
ISSN (Paper): 1063-9667
DOI: 10.1109/VLSI.2008.99
Regular:

Soft-errors are a leading cause of reliability issues during field operations. High-energy particles, either from cosmic rays or from impurities in the packaging material can disrupt charge stored... View More

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