IEEE - Institute of Electrical and Electronics Engineers, Inc. - Substrate Noise Rejection in a New Mixed-Signal Integration Technology

2008 IEEE Topical Meeting on Silicon Monolithic Integrated Circuits in RF Systems

Author(s): H. Sharifi ; S. Mohammadi
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 2008
Conference Location: Orlando, FL, USA
Conference Date: 23 January 2008
Page(s): 147 - 150
ISBN (CD): 978-1-4244-1856-5
ISBN (Paper): 978-1-4244-1855-8
DOI: 10.1109/SMIC.2008.43
Regular:

In this paper, a new mixed-signal substrate noise rejection technique is proposed and implemented using a recently-developed self-aligned wafer-level integration technology (SAWLIT). In this... View More

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