IEEE - Institute of Electrical and Electronics Engineers, Inc. - Failure-specific p-cycle network dual-failure restorability design

2007 6th International Workshop on Design and Reliable Communication Networks (DRCN)

Author(s): J. Doucette ; Wei Li ; Ming Zuo
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 October 2007
Conference Location: La Rochelle, France
Conference Date: 7 October 2007
Page(s): 1 - 9
ISBN (Paper): 978-1-4244-3824-2
DOI: 10.1109/DRCN.2007.4762274
Regular:

p-Cycle networks designed for single-failure restorability exhibit some inherent dual-failure restorability. With increasing concerns for providing greater dual-failure restorability,... View More

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