IEEE - Institute of Electrical and Electronics Engineers, Inc. - Monitoring of industrial process using intelligent tomography system

2007 International Conference on Intelligent and Advanced Systems

Author(s): T.M. Baloch ; Yu Kiong Chai
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 November 2007
Conference Location: Kuala Lumpur, Malaysia
Conference Date: 25 November 2007
Page(s): 1,115 - 1,119
ISBN (CD): 978-1-4244-1356-0
ISBN (Paper): 978-1-4244-1355-3
DOI: 10.1109/ICIAS.2007.4658558
Regular:

The paper presents the studies in electrical resistance tomography (ERT) and the implementation of ERT data acquisition system (DAS). The study of the system is carried out by performing lab... View More

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