IEEE - Institute of Electrical and Electronics Engineers, Inc. - Pulse evaluation of high voltage SIC diodes

2007 IEEE Pulsed Power Plasma Science - Conference Record

Author(s): H. O'Brien ; W. Shaheen ; S.B. Bayne ; Brett A. Hull ; A.K. Agarwal
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 June 2007
Conference Location: Albuquerque, NM, USA
Conference Date: 17 June 2008
Volume: 2
Page(s): 1,029 - 1,033
ISBN (CD): 978-1-4244-0914-3
ISBN (Paper): 978-1-4244-0913-6
DOI: 10.1109/PPPS.2007.4652365
Regular:

The U. S. Army Research Laboratory (ARL) is evaluating silicon carbide switches and diodes to determine the range of high power and pulsed power applications for which SiC is a sensible material... View More

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