IEEE - Institute of Electrical and Electronics Engineers, Inc. - Flash X-ray diffraction system for fast, single-pulse temperature and phase transition measurements

2007 IEEE Pulsed Power Plasma Science - Conference Record

Author(s): Dane V. Morgan ; Don R. Macy ; Michael J. Madlener ; Jiaming G. Morgan
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 June 2007
Conference Location: Albuquerque, NM, USA
Conference Date: 17 June 2008
Volume: 1
Page(s): 209 - 212
ISBN (CD): 978-1-4244-0914-3
ISBN (Paper): 978-1-4244-0913-6
DOI: 10.1109/PPPS.2007.4651823
Regular:

A new, fast, single-pulse diagnostic for determining phase transitions and measuring the bulk temperature of polycrystalline metal objects has been developed. The diagnostic consists of a 37-stage... View More

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