IEEE - Institute of Electrical and Electronics Engineers, Inc. - A test facility for PCSS triggered pulsed power switches

2007 IEEE Pulsed Power Plasma Science - Conference Record

Author(s): M. E. Swalby ; S. F. Glover ; F. J. Zutavern ; K. W. Reed ; M. J. Cich ; A. Mar ; T. A. Saiz ; M. L. Horry ; F.E. White
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 June 2007
Conference Location: Albuquerque, NM, USA
Conference Date: 17 June 2008
Volume: 1
Page(s): 101 - 105
ISBN (CD): 978-1-4244-0914-3
ISBN (Paper): 978-1-4244-0913-6
DOI: 10.1109/PPPS.2007.4651799
Regular:

The cost and complexity of pulsed power systems continue to increase as researchers strive for more precise control and flexibility. Systems with large numbers of switches or large numbers of... View More

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