IEEE - Institute of Electrical and Electronics Engineers, Inc. - Automatic Testbench Generation for Rearchitected Designs
2007 IEEE International Workshop on Microprocessor Test and Verification (MTV)
Author(s): | M. Nodine |
Publisher: | IEEE - Institute of Electrical and Electronics Engineers, Inc. |
Publication Date: | 1 December 2007 |
Conference Location: | Austin, TX, USA |
Conference Date: | 5 December 2007 |
Page(s): | 128 - 136 |
ISBN (Paper): | 978-0-7695-3241-7 |
ISSN (Paper): | 1550-4093 |
DOI: | 10.1109/MTV.2007.11 |
Regular:
This paper describes a tool for automated testbench generation used to compare a design against a cycle-accurate RTL reference model. The advantage of this tool is that it allows testing of design... View More