1.1 The techniques described in this guide pertain to mixed flowing gas (MFG) tests containing corrosive species that are applied to evaluate devices containing electrical contacts such as slip rings, separable connectors, electromechanical relays or switch contacts. These techniques may be relev...

1.1 This test method covers the use of the subthreshold charge separation technique for analysis of ionizing radiation degradation of a gate dielectric in a metal-oxide-semiconductor-field-effect transistor (MOSFET) and an isolation dielectric in a parasitic MOSFET. ^, <sup...

The design of a photovoltaic module or system intended to provide safe conversion of the sun's radiant energy into useful electricity must take into consideration the possibility of partial shadowing of the module(s) during operation. This test method describes a procedure for verifying that ...

1.1 This test method covers the use of the subthreshold charge separation technique for analysis of ionizing radiation degradation of a gate dielectric in a metal-oxide-semiconductor-field-effect transistor (MOSFET) and an isolation dielectric in a parasitic MOSFET. ^{, ...}

The formability of materials is affected by springback, the difference between the final shape of a part and the shape of the die that formed it. Materials having a large amount of springback create difficulties for the die designer and make die rework much more likely and complicated. This can ...