IEEE - Institute of Electrical and Electronics Engineers, Inc. - Automatic Testbench Generation for Rearchitected Designs

2007 IEEE International Workshop on Microprocessor Test and Verification (MTV)

Author(s): M. Nodine
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 December 2007
Conference Location: Austin, TX, USA
Conference Date: 5 December 2007
Page(s): 128 - 136
ISBN (Paper): 978-0-7695-3241-7
ISSN (Paper): 1550-4093
DOI: 10.1109/MTV.2007.11
Regular:

This paper describes a tool for automated testbench generation used to compare a design against a cycle-accurate RTL reference model. The advantage of this tool is that it allows testing of design... View More

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