IEEE - Institute of Electrical and Electronics Engineers, Inc. - Automatic Testbench Generation for Rearchitected Designs
2007 IEEE International Workshop on Microprocessor Test and Verification (MTV)
| Author(s): | M. Nodine |
| Publisher: | IEEE - Institute of Electrical and Electronics Engineers, Inc. |
| Publication Date: | 1 December 2007 |
| Conference Location: | Austin, TX, USA |
| Conference Date: | 5 December 2007 |
| Page(s): | 128 - 136 |
| ISBN (Paper): | 978-0-7695-3241-7 |
| ISSN (Paper): | 1550-4093 |
| DOI: | 10.1109/MTV.2007.11 |
Regular:
This paper describes a tool for automated testbench generation used to compare a design against a cycle-accurate RTL reference model. The advantage of this tool is that it allows testing of design... View More
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