IEEE - Institute of Electrical and Electronics Engineers, Inc. - Application of Automated Model Generation Techniques to Analog/Mixed-Signal Circuits

2007 IEEE International Workshop on Microprocessor Test and Verification (MTV)

Author(s): S. Little ; A. Sen ; C. Myers
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 December 2007
Conference Location: Austin, TX, USA
Conference Date: 5 December 2007
Page(s): 109 - 115
ISBN (Paper): 978-0-7695-3241-7
ISSN (Paper): 1550-4093
DOI: 10.1109/MTV.2007.17
Regular:

Abstract models of analog/mixed-signal (AMS) circuits can be used for formal verification and system-level simulation. The difficulty of creating these models precludes their widespread use. This... View More

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