IEEE - Institute of Electrical and Electronics Engineers, Inc. - On Automatic Test Block Generation for Peripheral Testing in SoCs via Dynamic FSMs Extraction

2007 IEEE International Workshop on Microprocessor Test and Verification (MTV)

Author(s): D. Ravotto ; E. Sanchez ; M. Schillaci ; M.S. Reorda ; G. Squillero
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 December 2007
Conference Location: Austin, TX, USA
Conference Date: 5 December 2007
Page(s): 71 - 76
ISBN (Paper): 978-0-7695-3241-7
ISSN (Paper): 1550-4093
DOI: 10.1109/MTV.2007.14
Regular:

Traditional test generation methodologies for peripheral cores resort heavily to low-level descriptions of the circuit, leading to long generation times. Methodologies based on high-level... View More

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