IEEE - Institute of Electrical and Electronics Engineers, Inc. - Runtime Verification of k-Mutual Exclusion for SoCs

2007 IEEE International Workshop on Microprocessor Test and Verification (MTV)

Author(s): S. Ikiz ; A. Sen
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 December 2007
Conference Location: Austin, TX, USA
Conference Date: 5 December 2007
Page(s): 44 - 50
ISBN (Paper): 978-0-7695-3241-7
ISSN (Paper): 1550-4093
DOI: 10.1109/MTV.2007.21
Regular:

We present an efficient runtime verification environment for detecting mutual exclusion predicates. Such predicates are important for keeping the safe operation of concurrent systems. Our... View More

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