IEEE - Institute of Electrical and Electronics Engineers, Inc. - Application of Lifting in Partial Design Analysis

2007 IEEE International Workshop on Microprocessor Test and Verification (MTV)

Author(s): M. Herbstritt ; V. Struve ; B. Becker
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 December 2007
Conference Location: Austin, TX, USA
Conference Date: 5 December 2007
Page(s): 33 - 38
ISBN (Paper): 978-0-7695-3241-7
ISSN (Paper): 1550-4093
DOI: 10.1109/MTV.2007.7
Regular:

In the past, we have investigated satisfiability-based combinational equivalence checking and bounded model checking of partial circuit designs, i.e., circuit designs where one or more... View More

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