IEEE - Institute of Electrical and Electronics Engineers, Inc. - Defects Detection on Aged Films

2007 Third International IEEE Conference on Signal-Image Technologies and Internet-Based System (SITIS)

Author(s): Yang-Ta Kao ; T.K. Shih ; Hsing-Ying Zhong ; B.C. Tsai ; Wen-Ju Tsai
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 December 2007
Conference Location: Shanghai, China
Conference Date: 16 December 2007
Page(s): 636 - 641
ISBN (Paper): 978-0-7695-3122-9
DOI: 10.1109/SITIS.2007.66
Regular:

Aged motion pictures may contain different types of defects, such as spikes and scratch lines. Each type of defect has its different properties. It is relatively hard to precisely detect these... View More

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