IEEE - Institute of Electrical and Electronics Engineers, Inc. - The development and challenges of millimeter wave test system for package level

2007 Asia-Pacific Conference on Applied Electromagnetics (APACE)

Author(s): Lim Chee Chiang ; N.A. Shairi
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 December 2007
Conference Location: Melaka, Malaysia
Conference Date: 4 December 2007
Page(s): 1 - 5
ISBN (CD): 978-1-4244-1435-2
ISBN (Paper): 978-1-4244-1434-5
DOI: 10.1109/APACE.2007.4603960
Regular:

The existing automated test system (ATS) for MMIC package level in Avago Technologies immature for the rigorous requirements of millimeter wave products testing. This has demanded the... View More

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