IEEE - Institute of Electrical and Electronics Engineers, Inc. - Theoretical basis and measurement techniques for SSN (Simultaneous switching noise) on FPGA (Field Programmable Gate Array) products

2007 Asia-Pacific Conference on Applied Electromagnetics (APACE)

Author(s): Wei Wei Lo ; L. Smith ; Geping Liu ; Man On Wong ; N. Daud
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 December 2007
Conference Location: Melaka, Malaysia
Conference Date: 4 December 2007
Page(s): 1 - 5
ISBN (CD): 978-1-4244-1435-2
ISBN (Paper): 978-1-4244-1434-5
DOI: 10.1109/APACE.2007.4603934
Regular:

With the increase of data rate and clock speed, as well as the decrease of power supply voltage on todaypsilas technology, simultaneous switching noise (SSN) has become critical in order for the... View More

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