IEEE - Institute of Electrical and Electronics Engineers, Inc. - Performance degradation of defective MEMS tunable RF filter

2007 Asia-Pacific Conference on Applied Electromagnetics (APACE)

Author(s): W. Wong ; H.T. Su ; K.C. Lee ; M.A.M. Ali ; B.Y. Majlis
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 December 2007
Conference Location: Melaka, Malaysia
Conference Date: 4 December 2007
Page(s): 1 - 5
ISBN (CD): 978-1-4244-1435-2
ISBN (Paper): 978-1-4244-1434-5
DOI: 10.1109/APACE.2007.4603931
Regular:

The common defects that could occur during the fabrication and long term operation of a tunable bandpass filter using RF MEMS switches are simulated with SONNET. The faulty responses of the... View More

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