IEEE - Institute of Electrical and Electronics Engineers, Inc. - Smart Attendance System by suing RFID

2007 Asia-Pacific Conference on Applied Electromagnetics (APACE)

Author(s): M.K. Yeop Sabri ; M.Z.A. Abdul Aziz ; M.S.R. Mohd Shah ; M.F. Abd Kadir
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 December 2007
Conference Location: Melaka, Malaysia
Conference Date: 4 December 2007
Page(s): 1 - 4
ISBN (CD): 978-1-4244-1435-2
ISBN (Paper): 978-1-4244-1434-5
DOI: 10.1109/APACE.2007.4603906
Regular:

The paper describes the development smart attendance system (SAS) that will take an attendance by using information extracted from the RFID database handling system. In order to have complete... View More

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