IEEE - Institute of Electrical and Electronics Engineers, Inc. - Modeling and simulation of finite state machine Memory Built-in Self Test architecture for embedded memories

2007 Asia-Pacific Conference on Applied Electromagnetics (APACE)

Author(s): N.Z. Haron ; S.A.M. Junos ; A. Razak ; M. Idris
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 December 2007
Conference Location: Melaka, Malaysia
Conference Date: 4 December 2007
Page(s): 1 - 5
ISBN (CD): 978-1-4244-1435-2
ISBN (Paper): 978-1-4244-1434-5
DOI: 10.1109/APACE.2007.4603901
Regular:

Memory built-in self test (MBIST) or as to it array built-in self test is an amazing piece of logic. Without any direct connection to the outside world, a very complex embedded memory can be... View More

Advertisement