IEEE - Institute of Electrical and Electronics Engineers, Inc. - Effect of SSN-induced PDN noise on a LVDS output buffer

2007 Asia-Pacific Conference on Applied Electromagnetics (APACE)

Author(s): J. Kho ; Chooi Ian Loh ; B. Krsnik ; Zhe Li ; Chee Seong Fong ; P. Boyle ; Man On Wong
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 December 2007
Conference Location: Melaka, Malaysia
Conference Date: 4 December 2007
Page(s): 1 - 5
ISBN (CD): 978-1-4244-1435-2
ISBN (Paper): 978-1-4244-1434-5
DOI: 10.1109/APACE.2007.4603878
Regular:

As the semiconductor nanotechnology process progresses, advanced devices achieve high performance by reducing parasitic effects, including logic variations caused by noise at SSN input and outputs... View More

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