IEEE - Institute of Electrical and Electronics Engineers, Inc. - Scaling trend of the Flash memory for file storage

2007 IEEE International Workshop on Memory Technology, Design and Testing (MTDT '07)

Author(s): R. Shirota
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 December 2007
Conference Location: Taipei, Taiwan
Conference Date: 3 December 2007
Page(s): 16
ISBN (CD): 978-1-4244-1655-4
ISBN (Paper): 978-1-4244-1656-1
ISSN (Paper): 1087-4852
DOI: 10.1109/MTDT.2007.4547606
Regular:

This paper describes the review of flash memory. First, the fundamental device and design characteristics of flash memory are shown. Next, recent developments of flash memory are reviewed. The... View More

Advertisement