IEEE - Institute of Electrical and Electronics Engineers, Inc. - Value creation and technological convergence by evolution of embedded non-volatile memory

2007 IEEE International Workshop on Memory Technology, Design and Testing (MTDT '07)

Author(s): H. Hidaka
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 December 2007
Conference Location: Taipei, Taiwan
Conference Date: 3 December 2007
Page(s): 13 - 14
ISBN (CD): 978-1-4244-1655-4
ISBN (Paper): 978-1-4244-1656-1
ISSN (Paper): 1087-4852
DOI: 10.1109/MTDT.2007.4547604
Regular:

Flash-MCU, micro-controller with embedded flash memory storage (eFlash), has seen a tremendous up-surge in real-time control application markets, with assumed 20% CAGR. The programmable code... View More

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