IEEE - Institute of Electrical and Electronics Engineers, Inc. - Diffraction of 2D complex beams by a perfect conductor half-plane: a spectral approach

International Conference - Days on Diffraction 2007

Author(s): R. Mahillo-Isla ; M.J. Gonzalez-Morales ; C. Dehesa-Martinez
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 May 2007
Conference Location: St. Petersburg, Russia
Conference Date: 29 May 2007
Page(s): 67 - 72
ISBN (Paper): 5-9651-0118-X
DOI: 10.1109/DD.2007.4531991
Regular:

The incidence of a complex beam on a perfect conducting half-plane is analyzed by the method of the angular plane wave spectrum decomposition. The rigorous analysis of the integral representation... View More

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