IEEE - Institute of Electrical and Electronics Engineers, Inc. - VRB Modelling for the Study of Output Terminal Voltages, Internal Losses and Performance

2007 IEEE Canada Electrical Power Conference (EPC '07)

Author(s): J. Chahwan ; C. Abbey ; G. Joos
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 October 2007
Conference Location: Montreal, Que., Canada
Conference Date: 25 October 2007
Page(s): 387 - 392
ISBN (CD): 978-1-4244-1445-1
ISBN (Paper): 978-1-4244-1444-4
DOI: 10.1109/EPC.2007.4520363
Regular:

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