IEEE - Institute of Electrical and Electronics Engineers, Inc. - Noise in CMOS LDOs

2007 International Semiconductor Conference, CAS 2007

Author(s): O. Profirescu ; C. Dinca ; C. Stanescu
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 October 2007
Conference Location: Sinaia, Romania
Conference Date: 15 October 2007
Volume: 2
Page(s): 563 - 566
ISBN (Paper): 978-1-4244-0847-4
ISSN (Paper): 1545-827X
DOI: 10.1109/SMICND.2007.4519786
Regular:

The paper presents the main noise sources in CMOS low dropout linear voltage regulators (LDOs), their simulation and measurement. The paper is focused on noise performance, which is of great... View More

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