IEEE - Institute of Electrical and Electronics Engineers, Inc. - An XPS Study on N Doped TiO 2 Sol-Gel Thin Films

2007 International Semiconductor Conference, CAS 2007

Author(s): P. Osiceanu ; M. Anastasescu ; C. Anastasescu ; C. Trapalis ; T. Giannakopoulou ; N. Todorova
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 October 2007
Conference Location: Sinaia, Romania
Conference Date: 15 October 2007
Volume: 2
Page(s): 353 - 356
ISBN (Paper): 978-1-4244-0847-4
ISSN (Paper): 1545-827X
DOI: 10.1109/SMICND.2007.4519733
Regular:

In this paper we report on a systematic XPS study on N doped TiO2 sol-gel thin films deposited by sol-gel technique. For this purpose, four kinds of multilayered TiO2 films... View More

Advertisement