IEEE - Institute of Electrical and Electronics Engineers, Inc. - Some Contributions to the Understanding of the Puzzle of Physical Processes of Degradation in Irradiated Silicon

2007 International Semiconductor Conference, CAS 2007

Author(s): S. Lazanu ; I. Lazanu ; M.L. Ciurea
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 October 2007
Conference Location: Sinaia, Romania
Conference Date: 15 October 2007
Volume: 2
Page(s): 319 - 322
ISBN (Paper): 978-1-4244-0847-4
ISSN (Paper): 1545-827X
DOI: 10.1109/SMICND.2007.4519724
Regular:

In the present paper, we intend to bring some clarifications related to the role played by primary defects in long term degradation, to the dependence of degradation on the orientation of the... View More

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