IEEE - Institute of Electrical and Electronics Engineers, Inc. - Comparative Characterization of PbS Macro- And Nano-Crystalline Photoresistive Detectors

2007 International Semiconductor Conference, CAS 2007

Author(s): G. Iordache ; M. Buda ; V. Stancu ; T. Botila
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 October 2007
Conference Location: Sinaia, Romania
Conference Date: 15 October 2007
Volume: 1
Page(s): 199 - 202
ISBN (Paper): 978-1-4244-0847-4
ISSN (Electronic): 2377-0678
ISSN (Paper): 1545-827X
DOI: 10.1109/SMICND.2007.4519680
Regular:

A comparative study of photodetector performance for nano- and micro-crystalline PbS thin layers is presented. Both types of PbS films were obtained using the Chemical Bath Deposition method. To... View More

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