IEEE - Institute of Electrical and Electronics Engineers, Inc. - Recent progress in laser terahertz emission microscopy toward high-resolution imaging

2007 Joint 32nd International Conference on Infrared and Millimeter Waves and the 15th International Conference on Terahertz Electronics (IRMMW-THz)

Author(s): Sunmi Kim ; H. Koga ; H. Murakami ; M. Tonouchi
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 September 2007
Conference Location: Cardiff, UK
Conference Date: 2 September 2007
Page(s): 1,006 - 1,008
ISBN (CD): 978-1-4244-1439-0
ISBN (Paper): 978-1-4244-1438-3
DOI: 10.1109/ICIMW.2007.4516830
Regular:

A laser terahertz emission microscope (LTEM) technique has become a valuable tool for both of basic science and industrial applications. Because THz radiation properties from semiconductor show... View More

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