IEEE - Institute of Electrical and Electronics Engineers, Inc. - A millimeter-wave sampled-line six-port reflectometer at 300GHz

2007 Joint 32nd International Conference on Infrared and Millimeter Waves and the 15th International Conference on Terahertz Electronics (IRMMW-THz)

Author(s): Guoguang Wu ; Zhiyang Liu ; R.M. Weikle
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 September 2007
Conference Location: Cardiff, UK
Conference Date: 2 September 2007
Page(s): 775 - 776
ISBN (CD): 978-1-4244-1439-0
ISBN (Paper): 978-1-4244-1438-3
DOI: 10.1109/ICIMW.2007.4516725
Regular:

The six-port reflectometer is believed to be applied in the next generation of network analyzer, especially as working at high frequency in the microwave region. In our work, a six- port circuit... View More

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