IEEE - Institute of Electrical and Electronics Engineers, Inc. - Highly sensitive birefringence measurement in THz frequency region and its application to stress measurement

2007 Joint 32nd International Conference on Infrared and Millimeter Waves and the 15th International Conference on Terahertz Electronics (IRMMW-THz)

Author(s): S.-i. Ebara ; Y. Hirota ; M. Tani ; M. Hangyo
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 September 2007
Conference Location: Cardiff, UK
Conference Date: 2 September 2007
Page(s): 666 - 667
ISBN (CD): 978-1-4244-1439-0
ISBN (Paper): 978-1-4244-1438-3
DOI: 10.1109/ICIMW.2007.4516673
Regular:

We have constructed a terahertz time-domain spectroscopy (THz-TDS) system which is able to detect a birefringence as small as Deltan ~ 5 times 10-4. This polarization sensitive... View More

Advertisement