IEEE - Institute of Electrical and Electronics Engineers, Inc. - Goodness-of-Fit Test-Statistics on Gaussian and Exponential Reliability Data

Author(s): Duan Wei ; C.Y. Chen
Sponsor(s): IEEE Reliability Society
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 December 1983
Volume: R-32
Page(s): 492 - 495
ISSN (Paper): 0018-9529
ISSN (Online): 1558-1721
DOI: 10.1109/TR.1983.5221740
Regular:

The paper presents three statisics for testing s-normality and one statistic for testing exponentiality in system reliability data. The distributions of these statistics were approximated by using... View More

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