IEEE - Institute of Electrical and Electronics Engineers, Inc. - Classification of strokes and identification of stroke location from the measured tower base currents of LPS to Indian satellite launch pad-I

2007 International Power Engineering Conference (IPEC 07)

Author(s): V. Hegde ; U. Kumar
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 December 2007
Conference Location: Singapore, Singapore
Conference Date: 3 December 2007
Page(s): 1,161 - 1,166
ISBN (Paper): 978-981-05-9423-7
Regular:

Performance of any engineering design needs to be evaluated in the field, irrespective of its sophistication. This is specifically true for lightning protection systems. Even though there are many... View More

Advertisement