IEEE - Institute of Electrical and Electronics Engineers, Inc. - Uncoupled mode-space simulation validity for double gate MOSFETs

2007 International Conference on Microelectronics

Author(s): Y.M. Sabry ; T.M. Abdolkader ; W.F. Farouk
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 December 2007
Conference Location: Cairo, Egypt
Conference Date: 29 December 2007
Page(s): 351 - 354
ISBN (CD): 978-1-4244-1847-3
ISBN (Paper): 978-1-4244-1846-6
DOI: 10.1109/ICM.2007.4497727
Regular:

The validity of the uncoupled mode space (UMS) approach for simulating double gate MOSFETs in the ballistic limit is examined. The mode space results are compared to the rigorous real space (RS)... View More

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