IEEE - Institute of Electrical and Electronics Engineers, Inc. - A Short-Term Measure of Dark Energy in Sparse Atomic Estimations

2007 41st Asilomar Conference on Signals, Systems and Computers (ACSSC '07)

Author(s): B.L. Sturm ; J.J. Shynk ; L. Daudet
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 November 2007
Conference Location: Pacific Grove, CA, USA
Conference Date: 4 November 2007
Page(s): 1,126 - 1,129
ISBN (CD): 978-1-4244-2110-7
ISBN (Paper): 978-1-4244-2109-1
ISSN (Paper): 1058-6393
DOI: 10.1109/ACSSC.2007.4487398
Regular:

A sparse atomic estimation involves finding a representation of a signal that uses terms with finite support drawn from an overcomplete dictionary. These terms can constructively and destructively... View More

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