IEEE - Institute of Electrical and Electronics Engineers, Inc. - Improving Robustness of Image Quality Measurement with Degradation Classification and Machine Learning

2007 41st Asilomar Conference on Signals, Systems and Computers (ACSSC '07)

Author(s): T.H. Falk ; Yingchun Guo ; Wai-Yip Chan
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 November 2007
Conference Location: Pacific Grove, CA, USA
Conference Date: 4 November 2007
Page(s): 503 - 507
ISBN (CD): 978-1-4244-2110-7
ISBN (Paper): 978-1-4244-2109-1
ISSN (Paper): 1058-6393
DOI: 10.1109/ACSSC.2007.4487263
Regular:

Image quality metrics can be classified as generic or degradation specific. Degradation specific measures perform poorly under "mismatched" conditions. Generic measures, on the other hand, may... View More

Advertisement