IEEE - Institute of Electrical and Electronics Engineers, Inc. - From (integrated) circuits to systems of systems on chip in five decades: How did and will (IC) test technology keep up?

2007 50th IEEE International Midwest Symposium on Circuits and Systems (MWSCAS '07)

Author(s): A. Ivanov
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 August 2007
Conference Location: Montreal, Que., Canada
Conference Date: 5 August 2007
Page(s): 1,542 - 1,543
ISBN (CD): 978-1-4244-1176-4
ISBN (Paper): 978-1-4244-1175-7
ISSN (Paper): 1548-3746
DOI: 10.1109/MWSCAS.2007.4488835
Regular:

The past five decades amount to mind boggling progress in IC design and manufacturing technology. In this period, we have gone from the inception of ICs to now what literally amounts to the... View More

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