IEEE - Institute of Electrical and Electronics Engineers, Inc. - A finite element-domain decomposition coupled resistance extraction method with virtual terminal insertion

2007 50th IEEE International Midwest Symposium on Circuits and Systems (MWSCAS '07)

Author(s): Bo Yang ; H. Murata
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 August 2007
Conference Location: Montreal, Que., Canada
Conference Date: 5 August 2007
Page(s): 1,425 - 1,428
ISBN (CD): 978-1-4244-1176-4
ISBN (Paper): 978-1-4244-1175-7
ISSN (Paper): 1548-3746
DOI: 10.1109/MWSCAS.2007.4488812
Regular:

In this paper, we present a finite element-domain decomposition coupled resistance extraction method to extract the on-resistance of a DMOS circuit from the layout data for the arbitrarily shaped... View More

Advertisement