IEEE - Institute of Electrical and Electronics Engineers, Inc. - Dual diode-Vth reduced power gating structure for better leakage reduction

2007 50th IEEE International Midwest Symposium on Circuits and Systems (MWSCAS '07)

Author(s): P. Khaled ; Jingye Xu ; M.H. Chowdhury
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 August 2007
Conference Location: Montreal, Que., Canada
Conference Date: 5 August 2007
Page(s): 1,409 - 1,412
ISBN (CD): 978-1-4244-1176-4
ISBN (Paper): 978-1-4244-1175-7
ISSN (Paper): 1548-3746
DOI: 10.1109/MWSCAS.2007.4488810
Regular:

Leakage has become one of the most dominant factors of power management and signal integrity of nanometer scale integrated circuits. Recently, power gating structures has proven to be effective in... View More

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