IEEE - Institute of Electrical and Electronics Engineers, Inc. - Analysis of subthreshold leakage reduction in CMOS digital circuits

2007 50th IEEE International Midwest Symposium on Circuits and Systems (MWSCAS '07)

Author(s): B.S. Deepaksubramanyan ; A. Nunez
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 August 2007
Conference Location: Montreal, Que., Canada
Conference Date: 5 August 2007
Page(s): 1,400 - 1,404
ISBN (CD): 978-1-4244-1176-4
ISBN (Paper): 978-1-4244-1175-7
ISSN (Paper): 1548-3746
DOI: 10.1109/MWSCAS.2007.4488809
Regular:

Leakage power dissipation is projected to grow exponentially in the next decade according to the International Technology Roadmap for Semiconductors (ITRS). This directly affects portable battery... View More

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