IEEE - Institute of Electrical and Electronics Engineers, Inc. - Delay and slew analysis of VLSI interconnects using difference model approach

2007 50th IEEE International Midwest Symposium on Circuits and Systems (MWSCAS '07)

Author(s): J.V.R. Ravindra ; M.B. Srinivas
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 August 2007
Conference Location: Montreal, Que., Canada
Conference Date: 5 August 2007
Page(s): 1,313 - 1,315
ISBN (CD): 978-1-4244-1176-4
ISBN (Paper): 978-1-4244-1175-7
ISSN (Paper): 1548-3746
DOI: 10.1109/MWSCAS.2007.4488792
Regular:

In high speed digital integrated circuits, inductive- coupling effects in interconnects can be significant and should be included for accurate delay-noise analysis. In this paper, an analytical... View More

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