IEEE - Institute of Electrical and Electronics Engineers, Inc. - Leakage aware full adder cell

2007 50th IEEE International Midwest Symposium on Circuits and Systems (MWSCAS '07)

Author(s): D.A.F. El-Dib ; H. Elsimary ; M.I. Elmasry
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 August 2007
Conference Location: Montreal, Que., Canada
Conference Date: 5 August 2007
Page(s): 968 - 971
ISBN (CD): 978-1-4244-1176-4
ISBN (Paper): 978-1-4244-1175-7
ISSN (Paper): 1548-3746
DOI: 10.1109/MWSCAS.2007.4488727
Regular:

In deep submicron technologies, static power dominates total power consumption. Introducing leakage awareness to the basic building blocks of parallel architectures is a decisive factor to cut off... View More

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