IEEE - Institute of Electrical and Electronics Engineers, Inc. - Face recognition for target detection on PCA features with outlier information

2007 50th IEEE International Midwest Symposium on Circuits and Systems (MWSCAS '07)

Author(s): Yen-Lun Chen ; Y.F. Zheng
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 August 2007
Conference Location: Montreal, Que., Canada
Conference Date: 5 August 2007
Page(s): 823 - 826
ISBN (CD): 978-1-4244-1176-4
ISBN (Paper): 978-1-4244-1175-7
ISSN (Paper): 1548-3746
DOI: 10.1109/MWSCAS.2007.4488700
Regular:

This work addresses face recognition for detecting a small and particular set of individuals over a huge population of people. A new approach is developed which uses training samples of both... View More

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