IEEE - Institute of Electrical and Electronics Engineers, Inc. - The analysis of power-related characteristics of FSM benchmarks

2007 50th IEEE International Midwest Symposium on Circuits and Systems (MWSCAS '07)

Author(s): Cao Cao ; B. Oelmann
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 August 2007
Conference Location: Montreal, Que., Canada
Conference Date: 5 August 2007
Page(s): 787 - 790
ISBN (CD): 978-1-4244-1176-4
ISBN (Paper): 978-1-4244-1175-7
ISSN (Paper): 1548-3746
DOI: 10.1109/MWSCAS.2007.4488695
Regular:

Benchmarking is a common way to evaluate the effectiveness of finite state machine (FSM) low-power methodologies. The serious problem in the existing standard benchmarks is that power-related... View More

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