IEEE - Institute of Electrical and Electronics Engineers, Inc. - Fault tolerance of feed-forward artificial neural network architectures targeting nano-scale implementations

2007 50th IEEE International Midwest Symposium on Circuits and Systems (MWSCAS '07)

Author(s): M. Vural ; A. Ozgur ; A. Schmid ; Y. Leblebici
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 August 2007
Conference Location: Montreal, Que., Canada
Conference Date: 5 August 2007
Page(s): 779 - 782
ISBN (CD): 978-1-4244-1176-4
ISBN (Paper): 978-1-4244-1175-7
ISSN (Paper): 1548-3746
DOI: 10.1109/MWSCAS.2007.4488693
Regular:

Several circuit architectures have been proposed to overcome logic faults due to the high defect densities that are expected to be encountered in the first generations of nanoelectronic systems.... View More

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