IEEE - Institute of Electrical and Electronics Engineers, Inc. - Modeling of temperature effects on nano-CMOS devices with the predictive technologies

2007 50th IEEE International Midwest Symposium on Circuits and Systems (MWSCAS '07)

Author(s): R. Kumar ; V. Kursun
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 August 2007
Conference Location: Montreal, Que., Canada
Conference Date: 5 August 2007
Page(s): 694 - 697
ISBN (CD): 978-1-4244-1176-4
ISBN (Paper): 978-1-4244-1175-7
ISSN (Paper): 1548-3746
DOI: 10.1109/MWSCAS.2007.4488674
Regular:

Predictive technology model (PTM) enables early device and circuit characterization by providing the research community the expected profiles of devices in the future technologies. The parameters... View More

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