IEEE - Institute of Electrical and Electronics Engineers, Inc. - A built in self test scheme for automatic interconnect fault diagnosis in multiple and single FPGA systems

2007 50th IEEE International Midwest Symposium on Circuits and Systems (MWSCAS '07)

Author(s): M.Y. Niamat ; A. Sahni ; M.M. Jamali
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 August 2007
Conference Location: Montreal, Que., Canada
Conference Date: 5 August 2007
Page(s): 229 - 232
ISBN (CD): 978-1-4244-1176-4
ISBN (Paper): 978-1-4244-1175-7
ISSN (Paper): 1548-3746
DOI: 10.1109/MWSCAS.2007.4488577
Regular:

Multiple-FPGA systems, comprising of several FPGAs, present a unique opportunity for self test. Past researchers in the area of FPGA testing have mostly focused on devising techniques for testing... View More

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