IEEE - Institute of Electrical and Electronics Engineers, Inc. - An undersampled duty cycle jitter BIST Circuit

2007 50th IEEE International Midwest Symposium on Circuits and Systems (MWSCAS '07)

Author(s): Kahn Li Lim ; Z. Zilic
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 August 2007
Conference Location: Montreal, Que., Canada
Conference Date: 5 August 2007
Page(s): 201 - 204
ISBN (CD): 978-1-4244-1176-4
ISBN (Paper): 978-1-4244-1175-7
ISSN (Paper): 1548-3746
DOI: 10.1109/MWSCAS.2007.4488570
Regular:

This paper presents a built-in-self-test (BIST) component that provides an enhancement to existing SerDes BIST measurements of duty cycle jitter. The measurement method provides better accuracy... View More

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