IEEE - Institute of Electrical and Electronics Engineers, Inc. - CMOS integrated system for magnetic field monitoring and gradient measurement in MRI environment

2007 50th IEEE International Midwest Symposium on Circuits and Systems (MWSCAS '07)

Author(s): V. Frick ; J. Pascal ; L. Hebrard ; J.-P. Blonde ; J. Felblinger
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 August 2007
Conference Location: Montreal, Que., Canada
Conference Date: 5 August 2007
Page(s): 69 - 72
ISBN (CD): 978-1-4244-1176-4
ISBN (Paper): 978-1-4244-1175-7
ISSN (Paper): 1548-3746
DOI: 10.1109/MWSCAS.2007.4488543
Regular:

This paper reports on a standard CMOS integrated system for monitoring the magnetic fields in MRI environments. The sub-micron technology circuit features three horizontal hall devices and their... View More

Advertisement